Spring Test Probes Description:
Product info: Spring test probes are to test IC chips and high-precision electronic devices. They can provide reliable connections and stable signal transmission. They are suitable for various IC chip testing needs.
Product features: Test probes are dual head dual move, flexible operation, and precise contact with chip pads. They ensure error-free testing and provide efficient testing performance.
Problem-solving: Test probes can solve poor contact, signal interference, high error, short lifespan, low efficiency, and poor adaptability. This ensures accurate and reliable test results every time.
Specifications: Test probes have wear-resistant and corrosion-resistant materials, diameter of ≥0.1mm, double head design, temp-resistance, electrical performance, service life, connection method, etc. This ensures the efficiency, stability, and reliability.
Applications: Test probes are often used in BGA tests, semiconductors, mobile phones, computers, and other electronic products. They are essential tools for electronic testing engineers.
Target industries: They are semiconductors, IC testing, mobile phones and communication devices, automotive electronics, computers and data storage devices, consumer electronics products, electronic testing and R&D laboratories, medical equipment, etc.
Benefits for customers: Spring test probes can improve testing accuracy, increase testing efficiency, extend equipment lifespan, reduce failure and rework rates, enhance product reliability, save production and operating costs, support diversified applications, etc.
Catalogs of IC Spring Test Probes:
Spring Test Probes Datasheet:
| Items | Details |
|---|---|
| Specifications | Type： Dual-Head Dual Move Probe. |
| Tip Material： Tungsten Steel / Gold-Plated Tip. optional. | |
| Probe Length： 5 mm to 150 mm, Custom. | |
| Tip Diameter： 0.1 mm to 0.5 mm, Custom. | |
| Plunger Tip Shape： Sharp/Flat/Round/Crown/Cone, Custom. | |
| Barrer Range： 0.5 mm to 3.0 mm, Custom. | |
| Barrer Diameter： 0.5/0.6/0.8/1.0/1.2/1.5/2.0/2.5/3.0 mm, Custom. | |
| Contact Resistance： ≥ 15 mΩ, Custom. | |
| Operating Temperature： -40°C to +150°C. | |
| Voltage Rating： 3.3V to 100 V, Custom. | |
| Current Rating： 1 A to 5 A, Custom. | |
| Frequency： < 2 GHz. | |
| Pitch： 0.4 mm to 1.5 mm, Custom. | |
| Durability： 10k to 2M cycles. | |
| Materials | Plunger Tip： Tungsten Steel, Gold-Plated Tungsten, or Stainless Steel, optional. |
| Barrel： Stainless Steel, Beryllium Copper, or Brass, optional. | |
| Spring： Stainless Steel, Music Wire, or Phosphor Bronze, optional. | |
| Finishing | Gold (Au)： optional. |
| Silver (Ag)： optional. | |
| Nickel (Ni)： bright, matte, optional. | |
| Platinum (Pt)： optional. | |
| Rhodium (Rh)： optional. | |
| Ruthenium (Ru)： optional. | |
| Palladium (Pd)： optional. | |
| Tungsten (W)： optional. | |
| Titanium (Ti)： optional. | |
| Chrome (Cr)： optional. | |
| Packaging | Individual Packaging： Transparent plastic bags, foam, or small boxes |
| 1 pcs per bag. | |
| Bulk Packaging： Plastic boxes, plastic bags, cartons, etc. | |
| 50 pcs, 100p cs, Custom |
Why Choose Johoty’s Spring Test Probes?
Johoty’s spring test probes have >10 shapes of plunger tip, flexible custom of length, diameter, strock, force, etc. Worthy of your trust!
Spring Test Probes Benefits:
High-precision Signal Transmission
Johoty helps you ensure that signal transmission is not interfered with, avoiding data loss or errors. Testing probes can maintain signal strength and reduce testing errors. Reduce interference and measurement errors caused by signal reflection during the testing process. Improve anti-interference ability to ensure the clarity and stability of test signals. Capable of accurately testing high-speed and high-frequency signals to ensure product quality.
Improve Testing Efficiency
We help you reduce testing time cycles and improve OEE and production efficiency. Minimize human errors, reduce manual intervention and misoperation, and improve the automated testing efficiency. By achieving higher precision, errors caused by poor contact or signal interference can be reduced, resulting in lower repair costs. Maintain stable contact and reduce testing errors.
High Adaptability and Compatibility
We help you adapt to various types of IC chips and testing equipment, enhancing the flexibility of your testing system. Capable of maintaining stable performance in high temperature, low temperature, and high humidity. Meet different testing standards and reduce equipment replacement. Ensure that various packaged IC chips can be tested to enhance the product’s application range. Supports multiple interfaces and adapts to various testing systems. Capable of processing high-speed and high-frequency signals, and adapting to various high-precision testing requirements.
Durability and Long Lifespan
Johoty helps you reduce the need for frequent probe replacement and lower operating costs. The probe maintains stable performance during long-term use, reducing errors caused by wear. Even after prolonged use, the probe can still maintain precise testing performance. Protect the probe from environmental impact and ensure long-term use. Effectively avoiding contact failure and performance degradation, extending the service life of test probes. Under strict testing conditions, the probe can work continuously and stably.
Spring Test Probes Applications:
Circuit Board Inspection
Spring test probes are used to test IC chips on circuit boards and detect signal quality, voltage and current, and PCB connectivity. During production, there may be minor issues on the circuit board, such as weak solder joints, poor chip contact, or current overload.
Spring test probes are like careful inspectors who can detect these issues and prevent them from affecting the use of electronic products. It’s like when you assemble a toy, if a small part hasn’t been properly installed, Johoty’s spring test probes can help you detect them and ensure that the toy operates perfectly.
High-frequency Signal Testing
Mobile phones and computers transmit high-frequency signals. IC chip spring test probes can help test impedance matching, noise and interference monitoring, and high-speed digital signal analysis. Test probes ensure they do not interfere with signals from other devices, without signal distortion, attenuation, or noise interference.
Just like you’re listening to music with headphones, Johoty’s spring test probes ensure that you won’t hear any noise or intermittent signals. The test probe measures the strength and clarity of the signal to ensure the smooth operation of the equipment.
Temperature Change Test
IC chips behave differently at different temperatures, and the chip performance is affected when temperatures are too high or too low. IC chip spring test probes can help test these chip performance in high or low temperatures, solve the instability of chip functions, the impact of temperature on signal transmission, and the problem of poor contact caused by temperature, ensuring that they can work stably in any situation.
In hot summer, mobile phones should also run normally and not shut down due to overheating caused by high temperatures. Johoty’s spring test probes can check whether the chip can cope with such temperature differences and maintain good performance.
Voltage and Current Detection
Voltage and current flow in every circuit, and IC chip spring test probes can help measure their values, power stability, power consumption, short circuits, and overloads, ensuring that they are within the correct range. Test probes can help solve voltage instability or high voltage, current overload or insufficient, electrical noise and interference, or overheating and chip damage.
If something wrong with the voltage or current, the equipment may malfunction. Just like when the battery is running low in your home appliance, its function may not be normal. Johoty’s spring test probes are like a battery detector, which can ensure stable current and voltage in the circuit, and enable the device to operate normally.
Signal Interference Test
Sometimes, the signal of electronic devices can be interfered with by other devices, such as signal distortion and attenuation, EMI, or errors caused by poor contact, resulting in unclear or intermittent signals. IC chip spring test probes can help check for the presence of these interferences. They can solve problems, such as identifying signal interference sources and analyzing the impact of interference on signal integrity.
It can locate the source of interference and ensure that there are no issues with signal transmission. It’s like when you listen to music with wireless headphones, if there is noise from other electronic devices nearby that affects the sound of the headphones, a test probe can identify the problem and solve it.
Integrated Circuit Testing
An integrated circuit (IC) is the integration of multiple functions into a small chip, and IC chip spring test probes can help check whether the various functions of the integrated circuit are normal. Including signal integrity testing, logic testing, functional verification, parameter measurement, and performance evaluation.
They can solve problems, such as signal distortion and attenuation, unstable power supply, logic errors, and functional abnormalities. It’s like putting multiple functions on a phone, Johoty’s spring test probes help us check if each function is working properly, ensuring that each chip can complete its tasks on time.
Automotive Electronic System Testing
The electronic systems in modern cars are becoming increasingly complex, including autonomous driving, navigation systems, and more. IC chip spring test probes help detect power systems, sensor signals, communication interfaces, control system testing, and more in automobiles. And solve problems such as unstable power supply voltage, signal interference and noise, sensor data errors, and control system failures.
Just like your battery-powered toy car, chips help it run on the track, and Johoty’s spring test probes ensure that these chips run smoothly on the car without any problems, ensuring that the car can travel smoothly.
Wireless Communication Testing
IC chip spring test probes are used for testing wireless communication devices, such as mobile phones, Wi Fi devices, etc., test signal quality, frequency response analysis, antenna performance evaluation, power output testing, etc., and ensure that their chips can stably receive and transmit signals.
IC Test probes can check the working status of chips, solve problems such as signal distortion and attenuation, insufficient or excessive power, frequency mismatch, etc., and ensure that wireless signals are not interfered with. It’s like when you make a phone call with your phone, Johoty’s spring test probes can ensure that the signal is stable, uninterrupted, and the call is clear.
Spring Test Probe Advantages:
High Precision Testing
Johoty’s spring test probes can provide very accurate test results, helping engineers accurately measure signals on circuit boards. The design of test probes is very meticulous, ensuring each test point can be precisely docked with the test probe contact surface. Like a magnifying glass, it can magnify every detail and allow engineers to see the circuit performance. It’s like doing mathematical calculations, the more accurate the solution, the more precise it is.
Long Term Stability
This type of test probe is very durable and can maintain test stability for a long time. Its structural design can prevent deformation or damage after multiple uses, ensuring that each test results are equally accurate. Imagine if you had a pencil that never wears out, the words you write would never blur, and Johoty’s spring test probes are such a tool.
Low Resistance Design
The low resistance characteristics of IC chip spring test probes can reduce signal loss during testing and ensure accurate transmission of measurement signals. It’s like using a very thin pipe to transport water, the water flow is not obstructed and can pass smoothly. There is no leakage phenomenon during the transmission of electrical signals, Johoty’s test probes can ensure that the test results will not be disturbed.
Anti-interference Ability
In complex circuits, there may be external electromagnetic signal interference during testing, and spring test probes can effectively resist these interferences to ensure accurate test data. Johoty’s test probes are like shields with protective shields that can block unwanted external interference and help engineers focus on testing target signals.
FAQ
1. Do high cost-effectiveness IC spring test probes sacrifice testing accuracy?
No, it is impossible. We are sure we must keep high quality and accuracy first! It is a MUST! We always provide the cost-effective while keeping high test accuracy! We hope to do long-term business!
And, we can do so based on our strong R&D capability, 5-axis and 6-axis CNC, CMM, CCD, perfect SCM, and lean manufacturing, Once again, we can give you competitive costs, high quality, and high accuracy.
2. How durable are these IC spring test probes?
IC spring test probes have the durability of more than 100,000 cycles. With stainless steel SK4, beryllium copper, or tungsten steel, the biggest life cycle can reach up to 500k cycles.
3. Do you offer customization services to meet specific testing needs?
Yes, we offer customization services, including probe size, force, current, shape, contact resistance, material selection, etc. Our customization is flexible and cost-effective based on our R&D’s CAD, FEA, SEM, and CMM. We can meet your target.
