Spring Test Probe Description:
Product Info: Johoty’s Spring Test Probe is a high-precision, reliable probe designed for ICT, FCT, and ATE testing. Made from top-quality materials, it ensures durability and long-term stability. The probe accurately contacts test points, enhancing testing precision and efficiency, and is widely used in various electronics manufacturing and testing processes.
Product Features: The Spring Test Probe’s main job is to provide a dependable electrical connection, ensuring accurate signal transmission. Its spring design allows for slight adjustments during testing to match different test point positions and pressure needs. With high conductivity and low contact resistance, it delivers stable results for various ICT and FCT testing demands.
Problem Solving: Johoty’s Spring Test Probe effectively addresses the instability issues of traditional probes in high-frequency signal testing. Thanks to its precision design and quality materials, it minimizes testing errors and improves reliability, especially for complex circuit boards and high-density connectors, ensuring product quality and testing efficiency.
Specifications: Our Spring Test Probe comes in various sizes to fit different testing needs. Standard lengths range from 10mm to 50mm, with adjustable spring pressure to suit customer requirements. Needle diameters range from 0.5mm to 1.5mm, accommodating different test point sizes and spacing. All sizes undergo rigorous testing to ensure high precision and consistency.
Application Areas: The Spring Test Probe is widely used in electronics manufacturing, semiconductor testing, circuit board production, communications equipment, and consumer electronics. Whether for ICT testing on PCB boards or FCT functional testing on components, this probe offers efficient and reliable testing solutions, making it a top choice for electronics testing engineers.
Target Industries: Our target customers include electronics manufacturers, semiconductor companies, circuit board producers, communications equipment suppliers, and consumer electronics makers. Whether for large-scale production or small-batch testing, Johoty’s Spring Test Probe delivers efficient solutions that enhance production efficiency and product quality.
Customer Benefits: With Johoty’s Spring Test Probe, customers benefit from precise testing results and dependable product performance. The probe’s sturdy build means fewer repairs and replacements, which helps cut down on overall expenses. Efficient testing helps customers cut down production time, upgrade product standards, and gain an advantage in the marketplace.
Spring Test Probe Datasheet:
| Category | Precision Range | Characteristics | Function | Benefits | Applications |
|---|---|---|---|---|---|
| Standard Test Probes | ±5 µm | Basic design, durable materials | General-purpose testing | Cost-effective, versatile | ICT, FCT, general electronic testing |
| Fine-Pitch Test Probes | ±2 µm | Designed for dense pitch applications | Precise contact in tight spaces | High accuracy in fine-pitch testing | High-density PCB testing |
| Low-Force Test Probes | ±3 µm | Minimal contact force to avoid damage | Reduces mechanical stress on test points | Protects delicate components | Sensitive electronic devices |
| High-Temperature Test Probes | ±10 µm | Withstands high temperatures | Operates under extreme conditions | Reliable performance in harsh environments | Automotive, aerospace testing |
| High-Current Test Probes | ±8 µm | Designed for high-current testing | Ensures accurate readings under high current | Reduces measurement errors at high currents | Power electronics, high-power circuits |
| High-Voltage Test Probes | ±12 µm | Insulated for high-voltage applications | Measures high-voltage signals safely | Prevents arcing and signal loss | Power supplies, high-voltage circuits |
| Low-Profile Test Probes | ±3 µm | Compact design for limited space | Fits in confined areas | Ideal for space-constrained applications | Portable electronics, compact devices |
| High-Frequency Test Probes | ±6 µm | Optimized for high-frequency signals | Maintains signal integrity at high frequencies | Accurate measurement of high-frequency signals | RF circuits, communication systems |
| Temperature-Compensated Test Probes | ±4 µm | Compensates for temperature variations | Stable performance across temperature changes | Consistent accuracy in fluctuating conditions | Industrial testing, environmental testing |
| Wear-Resistant Test Probes | ±7 µm | Enhanced durability for high wear applications | Long-lasting performance under repetitive use | Reduces maintenance frequency | High-volume production testing |
| Magnetic Test Probes | ±5 µm | Magnetic contact tips for special applications | Measures magnetic fields or components | Non-contact measurement capability | Magnetic components testing |
| Gold-Plated Test Probes | ±6 µm | Gold-plated tips for corrosion resistance | Ensures stable electrical contact | High durability and reliability | High-precision electronics |
| High-Speed Test Probes | ±4 µm | Designed for high-speed signal testing | Accurate high-speed signal measurement | Reduced signal distortion | High-speed digital circuits |
| Custom Shape Test Probes | ±8 µm | Tailored to specific shapes or designs | Custom fit for non-standard test points | Enhances flexibility in testing | Custom electronic assemblies |
| Temperature-Stable Test Probes | ±5 µm | Maintains performance across temperature variations | Reliable performance in varying temperatures | Consistent results under diverse conditions | Aerospace, defense industries |
| Insulated Test Probes | ±10 µm | Insulated to prevent electrical interference | Safe and accurate measurements | Reduces risk of short circuits | Sensitive electronic testing |
| High-Precision Test Probes | ±1 µm | Ultra-precise design for critical applications | High accuracy and minimal deviation | Ideal for high-precision tasks | Semiconductor testing, microelectronics |
| High-Load Test Probes | ±12 µm | Designed to handle high mechanical loads | Durable under significant physical stress | Enhanced reliability under heavy loads | Heavy-duty electronic testing |
| Miniaturized Test Probes | ±3 µm | Very small form factor for compact designs | Fits into very tight spaces | Ideal for miniature electronic devices | Portable electronics, micro-devices |
| Test Probes with Integrated Sensors | ±7 µm | Includes built-in sensors for additional measurements | Provides extra data (e.g., temperature, humidity) | Multi-functional testing capability | Advanced diagnostics, multi-variable testing |
| Contact Force | 0.1 – 5.0 N | Adjustable, consistent force | Ensures reliable electrical contact | Improves test accuracy and reliability | ICT, FCT |
| Spring Material | – | Stainless Steel, Phosphor Bronze | Durability, conductivity | Long lifespan, minimal wear | Electronics, automotive |
| Contact Resistance | 1 – 10 mΩ | Low resistance materials | Reduces signal attenuation | Enhances signal integrity | High-frequency testing |
| Spring Travel | 0.5 – 3.0 mm | Variable travel lengths | Accommodates different PCB thicknesses | Versatile for various board designs | Multi-layer PCBs |
| Contact Tip Shape | – | Conical, Flat, Dome | Fits specific pad sizes and shapes | Better pad alignment and reduced damage | Component testing, probe alignment |
| Temperature Range | -40°C to +125°C | Wide operating temperature | Stable performance in varying temperatures | Reliable in extreme conditions | Harsh environments, aerospace |
| Insulation Resistance | > 100 MΩ | High resistance | Prevents electrical shorts | Enhances safety and accuracy | High-voltage testing |
| Current Rating | 1 – 10 A | Rated for specific currents | Handles high current applications | Reduces risk of overheating | Power electronics testing |
| Shock Resistance | 1000 – 5000 g | High shock tolerance | Withstands mechanical impacts | Increases probe longevity | Industrial testing |
| Vibration Resistance | 10 – 1000 Hz | Vibration-proof design | Maintains contact under vibration | Ensures stable performance | Automotive, aerospace |
| Insertion Force | 0.2 – 2.0 N | Minimal insertion force | Easy to insert into test fixtures | Reduces operator fatigue | High-volume testing |
| Lifetime Cycles | 100,000 – 1,000,000 cycles | High cycle durability | Long-lasting performance | Cost-effective in the long run | High-reliability testing |
| Compliance with Standards | – | RoHS, CE, UL | Meets industry standards | Ensures safety and compatibility | Global compliance |
| Tip Diameter | 0.2 – 1.0 mm | Various diameters | Fits different test pad sizes | Provides flexibility in testing | Precision electronics |
| Probe Height Adjustment | ±0.5 mm | Adjustable height | Accommodates various board heights | Improves probe-to-pad alignment | Versatile testing setups |
| Spring Rate | 10 – 200 g/mm | Variable spring stiffness | Customizable force application | Tailored to specific testing requirements | Precision measurement |
| Contact Material | Gold, Silver, Nickel | High conductivity materials | Enhances signal transfer | Reduces contact wear | High-frequency applications |
| Probe Type | Pin, Blade, Needle | Different contact types | Suited for different testing needs | Versatile usage | Component and PCB testing |
| Electroplating | – | Gold, Nickel, Tin | Improves corrosion resistance | Increases durability and performance | Harsh environments, long-term testing |
| Design Tolerances | ±0.01 mm | Precision manufacturing | Ensures high accuracy | Reduces testing errors | High-precision electronics |
Why Choose Johoty’s Spring Test Probe As Your Priority?
Choose our high-precision Spring Test Probe with only 0.01mm error, a lifespan of up to 100,000 cycles, and a 0.5ms response time. Precise customization to meet your needs, with top performance at 15% less than the industry average. Order now for a more efficient and reliable testing process!
Spring Test Probe Benefits:
Quality Stability
Our Spring Test Probe is specially designed for ICT and FCT testing, offering up to 99.9% accuracy. Our Spring Test Probe goes through thorough testing and is built with premium materials, ensuring it stays reliable and minimizes the risk of wear and failure.
Feedback from clients shows a noticeable increase in testing consistency and stability, reducing rework and delays due to probe issues.
Cost Efficiency
Thanks to advanced manufacturing techniques and large-scale production, our Spring Test Probe comed at some of the most competitive prices on the market, saving you an average of 15%-20% compared to similar products.
The long-lasting design also means fewer replacements, further cutting down on overall costs. You get top-notch performance while maximizing your return on investment.
Fast Delivery
Our streamlined production and shipping process guarantees that you’ll receive your order within 10-15 business days after you place it. For urgent needs of Spring Test Probe, we offer expedited shipping and can deliver within 7 days.
Our speedy delivery helps you start testing sooner and reduces time-to-market, giving you an edge over competitors.
Custom Services
We offer comprehensive customization options, including size, materials, and shape of our Spring Test Probe to meet your specific needs. Our strong R&D team can design solutions tailored to your unique application scenarios.
With our custom services of Spring Test Probe, you receive test probes that perfectly fit your requirements, enhancing testing efficiency and effectiveness.
Spring Test Probe Applications:
1. Precision Electronics ICT Testing
- Background： In the production of high-precision electronic components, ICT testing is crucial for ensuring product quality. Well-known electronics manufacturers require their ICT testing systems to be extremely accurate and reliable to detect tiny electrical faults.
- Challenge： Due to the tiny size of the components, traditional testing probes struggle to make precise contact. Poor contact often occurs during testing, leading to inaccurate results.
- Solution：We provide high-precision Spring Test Probe that offers micrometer-level contact accuracy and excellent elasticity, making them ideal for reliable testing in tight spaces.
- Implementation：We replaced the traditional probes in the client’s ICT testing system with our Spring Test Probe. By optimizing the probe contact design, we achieved more stable contact force and test results.
- Results：The fault rate decreased by 30%, and production efficiency increased by 20%. The client noted that the improved testing accuracy significantly reduced rework and defect rates, greatly enhancing production line stability.
2. Advanced Battery Pack FCT Testing
- Background: Electric vehicle manufacturers need to perform FCT testing on battery packs to ensure their long-term stability and safety.
- Challenge: Battery packs have densely packed internal contacts and uneven surfaces, which require the testing probes to have excellent contact performance.
- Solution: We use our highly reliable Spring Test Probe, which feature adaptive contact capabilities, allowing them to maintain stable contact on irregular battery surfaces and provide accurate test data.
- Implementation: Our improved Spring Test Probe was used in the client’s FCT testing process for comprehensive testing of the battery packs, focusing particularly on the reliability of the battery contacts.
- Results: No contact issues were encountered during testing, and the accuracy of the test data improved by 25%.
3. High-Frequency Communication Equipment ICT Testing
- Background: High-frequency communication devices have very high demands on probe performance to ensure signal integrity and test data accuracy.
- Challenge: High-frequency signals are prone to noise interference, and the stability of the probe’s contact directly impacts the reliability of test results.
- Solution: Our Spring Test Probe uses special electromagnetic shielding technology in its design to effectively reduce noise interference and ensure stable transmission of high-frequency signals.
- Implementation: We applied these Spring Test Probe in ICT testing for high-frequency communication equipment, focusing on optimizing the signal path and conducting multiple tests to verify their effectiveness.
- Results: Signal integrity improved by 40%, and testing accuracy significantly increased. The client reported that Johoty’s Spring Test Probe greatly enhanced the reliability of high-frequency device testing.
4. Medical Electronics FCT Testing
- Background: Medical electronics require extremely precise testing to ensure safety and reliability during use.
- Challenge: Testing environments for medical devices demand high levels of biocompatibility and accuracy from test probes.
- Solution: Our Spring Test Probe is made from medical-grade materials, offering excellent biocompatibility while maintaining high testing accuracy.
- Implementation: These Spring Test Probe was used in FCT testing for medical electronics, with a focus on testing critical components of the devices.
- Results: The fault rate in device testing dropped by 50%, greatly enhancing device reliability. The client praised our Spring Test Probe for its high performance and stability, noting significant improvements in test accuracy and reliability.
5. ICT Testing for High-End Consumer Electronics
- Background: High-end consumer electronics, like smartphones and wearables, need each component to undergo thorough testing to ensure the quality of the final product.
- Challenge: As components become smaller and designs more complex, traditional probes struggle to meet the demands for precision and stability.
- Solution: We introduced our high-precision Spring Test Probe, which are designed to handle the testing needs of small components and provide stable contact.
- Implementation: These Spring Test Probe was fully integrated into the production lines for high-end consumer electronics, with each testing phase optimized and validated.
- Results: The pass rate for products increased by 35%, and testing efficiency during production improved by 20%. The client noted that this greatly boosted the product’s market competitiveness.
6. ICT Applications in Semiconductor Testing
- Background: In semiconductor manufacturing, ICT testing is crucial for ensuring chip quality, with extremely high requirements for probe precision and stability.
- Challenge: Semiconductor chips are complex and tiny, making it hard for standard probes to provide the necessary stability and accuracy.
- Solution: Our custom-designed Spring Test Probe for semiconductor testing offer high stability and precision, meeting the needs of chip testing.
- Implementation: These Spring Test Probe was used in ICT testing for semiconductor production, and its performance was thoroughly evaluated.
- Results: Testing accuracy improved by 45%, and the fault rate during testing dropped by 30%. The client reported that the high precision and stability of our probes significantly enhanced chip quality control.
7. FCT Testing for Industrial Automation Equipment
- Background: FCT testing for industrial automation equipment involves a thorough check of complex electrical systems to ensure the equipment’s stability under various operating conditions.
- Challenge: The electrical systems in automation equipment are complex and varied, requiring test probes to have high contact stability and durability.
- Solution: Our high-reliability Spring Test Probe offers exceptional durability and stability, capable of handling complex electrical testing environments.
- Implementation: These Spring Test Probe was used in FCT testing for industrial automation equipment, with a focus on key electrical components within the system.
- Results: Testing stability improved by 30%, and the fault rate decreased by 25%. The client noted that this significantly enhanced the equipment’s operational reliability and production efficiency.
8. ICT and FCT Applications for High-Precision Testing Instruments
- Background: High-precision testing instruments require rigorous ICT and FCT testing during production to ensure their measurement accuracy and reliability.
- Challenge: The accuracy requirements for testing instruments are extremely high, putting strict demands on the performance of test probes.
- Solution: Our Spring Test Probe provides very high accuracy and stability, meeting the testing needs of high-precision instruments.
- Implementation: These Spring Test Probe was fully applied in the production process of high-precision testing instruments, with detailed testing and calibration.
- Results: The accuracy of the testing instruments improved by 50%, and the fault rate during testing dropped by 35%. The client reported that this greatly enhanced the performance and reliability of the testing instruments.
Spring Test Probe Advantages:
Unmatched Precision, Boosting Testing Confidence
- Our Spring Test Probe delivers unmatched precision in ICT and FCT with an error margin of just ±0.01mm. This level of accuracy ensures every test is extremely precise, significantly reducing errors. You can rely on consistent and dependable results at every testing stage, which minimizes quality issues caused by test errors.
- Compared to standard probes on the market, our Spring Test Probe improves accuracy by 50%, reducing false positives and negatives, and greatly enhancing consistency and production efficiency. This high level of precision allows us to offer the most reliable testing solutions, ensuring your production line maintains top-notch quality control.
Exceptional Durability, Reducing Replacement Frequency
- Manufactured from high-hardness alloy materials, our Spring Test Probe can withstand up to 5 million test cycles with minimal wear. This remarkable toughness means the spring test probe lasts longer and needs to be replaced less often, which cuts down on maintenance and replacement hassles. Our Spring Test Probe outlasts other similar products by 40%, offering superior durability.
- This means fewer interruptions and maintenance costs due to probe wear, significantly boosting production efficiency and cost-effectiveness. You can focus on production and quality control without worrying about frequent probe replacements.
Quick Response, Optimizing Production Efficiency
- Our Spring Test Probe features a millisecond-level response time, maintaining stable performance even in high-frequency testing environments or large-scale production lines. The quick response time keeps testing running smoothly and boosts overall production efficiency.
- Compared to ordinary probes, our Spring Test Probe offers a 30% improvement in response speed, allowing you to accelerate testing, shorten production cycles, and run your production line more efficiently. Faster response times boost production efficiency and help you meet market demands more swiftly, increasing production flexibility.
High-Temperature Stability, Ensuring Reliable Testing
- Our Spring Test Probe maintains stable performance in environments up to 150°C, ensuring accuracy even under extreme conditions. This high-temperature stability allows the probe to perform reliably in hot environments, ensuring dependable test results. Compared to other products, our Spring Test Probe offers a 25% improvement in high-temperature stability, providing reliable support for applications in extreme conditions.
- Whether for high-temperature testing or special environment testing, our probe delivers excellent performance, maintaining accuracy and consistency despite environmental changes.
High Compatibility, Adapting to Various Testing Platforms
- Designed to be compatible with a wide range of testing platforms and systems, our Spring Test Probe meets both standard and customized testing needs. No matter what testing equipment you use, our probe integrates seamlessly, ensuring smooth testing processes.
- Our design leads the market with a 20% improvement in compatibility, enhancing testing flexibility and simplifying system integration. This means you can use our probe across different production lines and devices without extra adjustments, greatly boosting work efficiency and testing convenience.
Perfect Customization, Meeting Your Unique Needs
- We offer comprehensive customization services for our Spring Test Probe, designing and manufacturing it based on your specific requirements. From probe size and material to functionality, we can tailor spring test probe precisely to meet your testing needs.
- Our top-notch customization guarantees a perfect match and helps clients cut development costs by around 15%. Our precise customization service not only enhances testing efficiency and accuracy but also provides more options and flexibility, helping you better meet market demands and challenges.
FAQ
The probe uses constant contact force provided by spring pressure to ensure a stable connection with the tested board. The probe tip aligns with the test point, establishing a physical connection through the compression and release of the spring. This can enable the transmission and measurement of signals or currents.
When selecting, consider the size of the test points, probe spacing, test current, required contact force, and testing environment. Understanding the specific requirements and testing conditions of the tested board is crucial.
Lower contact impedance results in higher signal quality. High-quality probe designs minimize contact impedance, enhancing test accuracy and reliability.
The lifespan of the probe is influenced by various factors. Including contact force, testing frequency, and environmental conditions. Regularly cleaning the ICT/FCT spring test probe heads and replacing worn probes can extend their lifespan.
Minimize damage by selecting appropriate contact force and high-quality ICT spring test probe tip materials. Use precise alignment techniques to ensure the probe makes correct contact with test points.
Use micro or high-density layout-specific ICT spring test probes designed for tightly packed test points. Precise positioning and advanced testing strategies are also necessary.
Evaluate cost-effectiveness based on probe lifespan, maintenance costs, test efficiency, and failure rates. Choosing a reliable ICT spring test probe with minimal maintenance requirements can reduce long-term costs.
Optimize probe layout in test fixture design to ensure uniform contact pressure and effective signal transmission. Consider the layout of the tested board and distribution of test points.
Minimize signal loss and interference by selecting appropriate ICT/FCT spring test probe and testing parameters. Using high-quality connecting wires and interface boards, and employing suitable signal processing techniques.
Depending on specific testing requirements, we can customize the ICT/FCT spring test probe in length, diameter, tip shape, and material. Work closely with us to ensure custom probes fully meet your testing requirements.
